Technical Report CS0314

Title: Mutations and Test for VLSI Chips
Authors: Shmuel Katz
Abstract: Test generation is considered for a family of existing testing methodologies for VLSI chips. The methodologies have in common that errors on a chip are reflected as changes (called mutations) in a program-level description of the implemented algorithms. Testing criteria are developed for two types of mutants, and techniques from program verification are used to define a collection of predicates which input data must satisfy in order to be an adequate test. The actual generation of the values is considered, and it is shown under what conditions a chip which passes such a test is guaranteed error-free.
CopyrightThe above paper is copyright by the Technion, Author(s), or others. Please contact the author(s) for more information

Remark: Any link to this technical report should be to this page (, rather than to the URL of the PDF files directly. The latter URLs may change without notice.

To the list of the CS technical reports of 1984
To the main CS technical reports page

Computer science department, Technion